Fundamentals of Nanoscale Film Analysis /
Material type: TextLanguage: English Publication details: New York: Springer, 2007Edition: 1Description: 336ISBN: 978-0-387-29260-1Contained works: Mayer,, James WSubject(s): Physics | Nano Technology | Nano ScienceDDC classification: 621.381 52Item type | Current library | Call number | Status | Date due | Barcode |
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BK | Kannur University Central Library | 621.381 52 ALF/ (Browse shelf (Opens below)) | Available | 30305 | |
BK | Kannur University Central Library | 621.381 52 ALF/ (Browse shelf (Opens below)) | Available | 30864 |
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621.381 514 FOW/ Electronic instrument design: architecting for the life cycle / | 621.381 52 AKS/ Semiconductor electronics / | 621.381 52 ALF/ Fundamentals of Nanoscale Film Analysis / | 621.381 52 ALF/ Fundamentals of Nanoscale Film Analysis / | 621.381 52 BHA/S Semiconductor optoelectronics devices | 621.381 52 BOR/ Semi-conducting silicides | 621.381 52 CUL/ Physics of Semiconductor Devices / |
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