Fundamentals of Nanoscale Film Analysis /

By: Alford,, Terry LContributor(s): Feldman,, Leonard CMaterial type: TextTextLanguage: English Publication details: New York: Springer, 2007Edition: 1Description: 336ISBN: 978-0-387-29260-1Contained works: Mayer,, James WSubject(s): Physics | Nano Technology | Nano ScienceDDC classification: 621.381 52
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Item type Current library Call number Status Date due Barcode
BK BK Kannur University Central Library
621.381 52 ALF/ (Browse shelf (Opens below)) Available 30305
BK BK Kannur University Central Library
621.381 52 ALF/ (Browse shelf (Opens below)) Available 30864

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