Your search returned 2 results.

1.
Applied survival analysis : regression modeling of time to event data

by Hosmer, David W | Lemeshow, Stanley | May, Susanne.

Edition: 2nd ed.Material type: Text Text Publication details: Hoboken, N.J. : Wiley-Interscience, c2008Availability: Items available for loan: Call number: 610.727 HOS/A (1).

2.
Applied logistic regression

by Hosmer, David W | Lemeshow, Stanley | Sturdivant, Rodney X.

Edition: 3rd.Material type: Text Text Publication details: New Jersey Johnn Wiley & Sons 2013Availability: Items available for loan: Call number: 519.536 HOS/A (1).

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