TY  - BOOK
AU  - Alford,, Terry L
AU  - Feldman,, Leonard C
AU  - Mayer,, James W
TI  - Fundamentals of Nanoscale Film Analysis / 
SN  - 978-0-387-29260-1
U1  - 621.381 52 
PY  - 2007///
CY  - New York
PB  - Springer
KW  - Physics
KW  - Nano Technology
KW  - Nano Science
ER  -